Shimadzu SPM-8100FM (probe microscope)

2017: Announcement of model

On July 18, 2017 the Japanese company Shimadzu Corporation announced an exit of the new scanning probe microscope (SPM) of SPM-8100FM. The device is upgraded version of the previous SPM-8000FM model produced in 2014 and which became the SZM first-ever rule providing the same high definition of the image at a research in air or liquid as in a vacuum.

Among innovation advantages the producer specifies five times shorter time of image capture, four times broader range of scanning (the maximum range of scanning in axes of XY is 10 microns), ultrahigh image resolution at a research in air or liquids, equivalent to scanning in a vacuum.

SPM-8100FM belongs to the class of atomic and power microscopes which allows to study structure of surfaces of samples at the nanometer level and to receive the digital three-dimensional image of an atomic grid.

Using the scanning probe microscope of SPM-8100FM it is possible to receive the high-sharp image of a surface of samples from metals, semiconductors, organic polymers, biological materials, etc. Also the device is intended for studying of structure of an interface of firm and liquid phases.

In addition to the improved parameters of permission and time of obtaining the image the producer expanded program opportunities of the device for increase in its functionality. In particular, the system of rapprochement of the probe with a sample is improved and the risk of collision of the probe with a surface is reduced. Among other useful innovations - display on the display of the signal corresponding to the movement of the probe and also support of two monitors.

As the producer assures, innovations do the scanning probe microscope of SPM-8100FM more convenient and simple in use and will allow personnel to master^[1] quicker].

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